RECORDING CHARACTERISTICS OF BaM THIN FILMS.

被引:0
|
作者
Morisako, A. [1 ]
Matsumoto, M. [1 ]
Naoe, M. [1 ]
机构
[1] Shinshu Univ, Nagano, Jpn, Shinshu Univ, Nagano, Jpn
来源
关键词
FERRITE DEVICES - Thin Films - MAGNETIZATION - Thermal Effects;
D O I
暂无
中图分类号
学科分类号
摘要
Evaluations are presented of recording density when using ring heads with relatively wide apertures on thin films of different c-axis orientation used for disk media, as are evaluations of the thermal stability of Ba-ferrite (BaM) thin films. The possibility of obtaining a high recording density thin film with small c-axis orientation was clearly established. Changes in residual magnetization with respect to temperature variation were measured, revealing that when the film was left to stand for 15 h at 250 degree C, approximately 10% thermal demagnetization occurred, and the film was almost completely demagnetized at 375 degree C.
引用
收藏
页码:1157 / 1158
相关论文
共 50 条
  • [41] Preparation of manganese oxide thin films.
    Ching, S
    Gray, TP
    Neupane, RP
    Hughes, SM
    Welch, EJ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2004, 227 : U1456 - U1456
  • [42] Photophysical properties of oligothiophene thin films.
    Spano, FC
    Zhao, Z
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2004, 228 : U498 - U498
  • [43] PERMEABILITY OF SPUTTERED CoNbTi THIN FILMS.
    Yamamoto, M.
    Zhang, J.
    Morita, H.
    Fujimori, H.
    IEEE translation journal on magnetics in Japan, 1984, TJMJ-1 (06): : 752 - 753
  • [44] LASER ANNEALING OF ZnO THIN FILMS.
    Bertolotti, M.
    Ferrari, A.
    Jaskow, A.
    Palma, A.
    Verona, E.
    1600, (56):
  • [45] On Thermodynamics of Thin Films. J Potential
    Rusanov, A. I.
    COLLOID JOURNAL, 2020, 82 (01) : 54 - 61
  • [46] Reactive sputtering of ZnO thin films.
    Kowach, GR
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 221 : U729 - U730
  • [47] THICKNESS CHECKING FOR THIN METAL FILMS.
    Konev, V.A.
    Lyubetskii, N.V.
    Tseitlin, Ya.M.
    1600, (27):
  • [48] Diamond thin films. Deposition and applications
    Gicquel, A.
    Vide, les Couches Minces, 1992, (261):
  • [49] ELLIPSOMETRIC INVESTIGATION OF THIN PERMALLOY FILMS.
    Brudzewski, Kazimierz
    Mendyk, Janusz
    Zagorska, Malgorzata
    Conder, Kazimierz
    Electron Technology (Warsaw), 1980, 13 (1-2): : 111 - 116
  • [50] XRD Analysis of Tungsten Thin Films.
    Djerdj, I.
    Tonejc, A. M.
    Tonejc, A.
    Radic, N.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2004, 60 : S242 - S242