Study of point defect clusters in high purity single crystals of silicon grown by Czochralski and float-zone methods by diffuse X-ray scattering technique

被引：0

|

作者：

Natl Physical Lab, New Delhi, India ^{[1
]}

机构：

来源：

J Cryst Growth | / 4卷 / 377-382期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

收藏

相关论文

共 50 条

[1] STUDY OF POINT-DEFECT CLUSTERS IN HIGH-PURITY SINGLE-CRYSTALS OF SILICON GROWN BY CZOCHRALSKI AND FLOAT-ZONE METHODS BY DIFFUSE-X-RAY SCATTERING TECHNIQUE
RAMANAN, RR
BHAGAVANNARAYANA, G
LAL, K
JOURNAL OF CRYSTAL GROWTH, 1995, 156 (04) : 377 - 382
[2] A comparative study of point defect aggregates in high purity single crystals of silicon grown by the czochralski and the float zone methods
Ramanan, RR
Bhagavannarayana, G
Lal, K
SEMICONDUCTOR DEVICES, 1996, 2733 : 269 - 273
[3] A HIGH-RESOLUTION DIFFUSE-X-RAY SCATTERING STUDY OF DEFECTS IN DISLOCATION-FREE SILICON-CRYSTALS GROWN BY THE FLOAT-ZONE METHOD AND COMPARISON WITH CZOCHRALSKI-GROWN CRYSTALS
LAL, K
BHAGAVANNARAYANA, G
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1989, 22 : 209 - 215
[4] DIFFUSE X-RAY SCATTERING STUDY OF POINT DEFECT CLUSTERS IN BISMUTH GERMANATE SINGLE CRYSTALS.
Bhagavannarayana, G.
Choubey, A.
Shubin, Yu.
Lal, Krishan
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 547 - 547
[5] HIGH RESOLUTION DIFFUSE X-RAY SCATTERING STUDY OF POINT DEFECT CLUSTERS IN NATURAL DIAMOND CRYSTALS
Ramanan, R. R.
Lal, Krishan
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1996, 52 : C522 - C522
[6] High-resolution X-ray diffraction investigations of silicon grown by the float-zone method
Molodkin, VB
Ando, M
Kislovskii, EN
Olikhovskii, SI
Vladimirova, TP
Reshetnyk, OV
Len, EG
Evgrafova, EA
Pervak, EV
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII, 2002, 24 (04): : 541 - 552
[7] HIGH-RESOLUTION DIFFUSE-X-RAY SCATTERING STUDIES OF SILICON SINGLE-CRYSTALS GROWN BY FLOAT ZONE METHOD
LAL, K
GOSWAMI, SNN
ACTA CRYSTALLOGRAPHICA SECTION A, 1984, 40 : C333 - C333
[8] Microdefects Revealed by X-ray Diffuse Scattering in Czochralski-Grown Dislocation-Free Silicon Single Crystals
Bublik, V. T.
Zotov, N. M.
CRYSTALLOGRAPHY REPORTS, 1997, 42 (06) : 1033 - 1037
[9] DIFFUSE X-RAY SCATTERING IN HIGH PURITY MOLYBDENUM SINGLE CRYSTALS.
Braude, I.S.
Kaufmann, H.J.
Startsev, V.I.
Physics of Metals and Metallography, 1986, 62 (01): : 189 - 192
[10] STUDY OF POINT-DEFECT CLUSTERS IN HYDROGEN IMPLANTED SILICON BY X-RAY DIFFUSE-SCATTERING
BEAUFORT, MF
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1992, 62 (04): : 478 - 483

← 1 2 3 4 5 →