Temperature dependence and magnetic field modulation of critical currents in step-edge SNS YBCO/Au junctions

被引：0

作者：

Missert, N. ^{[1
]}

Vale, L.R. ^{[1
]}

Ono, R.H. ^{[1
]}

Reintsema, C.D. ^{[1
]}

Rudman, D.A. ^{[1
]}

Thomson, R.E. ^{[1
]}

Berkowitz, S.J. ^{[1
]}

机构：

[1] Sandia Natl Lab, Albuquerque, United States

来源：

IEEE Transactions on Applied Superconductivity | 1995年 / 5卷 / 2 pt 3期

关键词：

Atomic force microscopy - Critical currents - Current voltage characteristics - Magnetic fields - Modulation - Photolithography - Photoresists - Pulsed laser applications - Sputter deposition - Strontium compounds - Thermal effects - Transport properties;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

We compare the electrical transport properties of superconductor-normal metal-superconductor SNS step-edge YBCO/Au junctions where the Au is deposited at 100°C and 600°C. For both types of junctions we observe resistively shunted junction current-voltage characteristics. The critical currents Ic in all cases are similar for a given ratio of YBCO thickness-to-step height, while the normal resistance Rn for the Au deposited at 600°C is consistently 25% lower than for the Au deposited at 100°C. The normalized temperature dependence of the IcRn product is nearly identical for all junctions with Au deposited at high temperatures but varies among junctions on a single chip for Au deposited at 100°C. Low magnetic field modulation of the critical current can show either the expected Fraunhofer-like pattern or a double-junction modulation for both types of devices. The modulation period is consistently a factor of 3 lower for the high-temperature deposited Au.

引用

页码：2969 / 2972