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In-plane strain and strain relaxation in laterally patterned periodic arrays of Si/SiGe quantum wires and dot arrays
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[41]
Evolution of ordered one-dimensional and two-dimensional InAs/InP quantum dot arrays on patterned InP (100) and (311)B substrates by self-organized anisotropic strain engineering
Sritirawisarn, N.
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0
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Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Sritirawisarn, N.
Wera, J. L. E.
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0
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0
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0
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Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Wera, J. L. E.
van Otten, F. W. M.
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0
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0
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0
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Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
van Otten, F. W. M.
Notzel, R.
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0
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0
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0
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Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Notzel, R.
JOURNAL OF CRYSTAL GROWTH,
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[42]
Formation of linear InAs/InGaAsP/InP (100) quantum dot arrays by self-organized anisotropic strain engineering in chemical beam epitaxy
Sritirawisarn, N.
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Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Sritirawisarn, N.
van Otten, F. W. M.
论文数:
0
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0
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0
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Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
van Otten, F. W. M.
Eijkemans, T. J.
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Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
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Eijkemans, T. J.
Notzel, R.
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Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
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Evaluation of strain balancing layer thickness for InAs/GaAs quantum dot arrays using high resolution x-ray diffraction and photoluminescence
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Rochester Inst Technol, NanoPower Res Labs, Rochester, NY 14623 USA
Bailey, Christopher G.
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Rochester Inst Technol, NanoPower Res Labs, Rochester, NY 14623 USA
Rochester Inst Technol, NanoPower Res Labs, Rochester, NY 14623 USA
Hubbard, Seth M.
Forbes, David V.
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Rochester Inst Technol, NanoPower Res Labs, Rochester, NY 14623 USA
Rochester Inst Technol, NanoPower Res Labs, Rochester, NY 14623 USA
Forbes, David V.
Raffaelle, Ryne P.
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Rochester Inst Technol, NanoPower Res Labs, Rochester, NY 14623 USA
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Raffaelle, Ryne P.
APPLIED PHYSICS LETTERS,
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[44]
Combining selective area growth and self-organized strain engineering for site-controlled local InAs/InP quantum dot arrays
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Eindhoven Univ Technol, COBRA Res Inst, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
Eindhoven Univ Technol, COBRA Res Inst, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
Wang, Jia
Yuan, Jiayue
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Eindhoven Univ Technol, COBRA Res Inst, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
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van Otten, Frank W. M.
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Eindhoven Univ Technol, COBRA Res Inst, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
Eindhoven Univ Technol, COBRA Res Inst, Dept Appl Phys, NL-5600 MB Eindhoven, Netherlands
van Otten, Frank W. M.
Noetzel, Richard
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Univ Politecn Madrid, ISOM Inst, ETSI Telecommun, E-28040 Madrid, Spain
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Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
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Eindhoven Univ Technol, COBRA Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
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机构:
CEA, LETI, MINATEC Campus, F-38054 Grenoble, France
Univ Grenoble Alpes, F-38000 Grenoble, France
CEA, LETI, MINATEC Campus, F-38054 Grenoble, France
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Coquand, R.
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0
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CEA, LETI, MINATEC Campus, F-38054 Grenoble, France
Univ Grenoble Alpes, F-38000 Grenoble, France
CEA, LETI, MINATEC Campus, F-38054 Grenoble, France
Coquand, R.
Barraud, S.
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CEA, LETI, MINATEC Campus, F-38054 Grenoble, France
Univ Grenoble Alpes, F-38000 Grenoble, France
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CEA, LETI, MINATEC Campus, F-38054 Grenoble, France
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APPLIED PHYSICS LETTERS,
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X-ray diffraction mapping of strain fields and chemical composition of SiGe:Si(001) quantum dot molecules -: art. no. 121308
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Lab Nacl Luz Sincrotron, BR-13084971 Campinas, SP, Brazil
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机构:
Eindhoven Univ Technol, COBRA Inter Univ Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
Eindhoven Univ Technol, COBRA Inter Univ Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
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论文数:
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Eindhoven Univ Technol, COBRA Inter Univ Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
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Eindhoven Univ Technol, COBRA Inter Univ Res Inst Commun Technol, NL-5600 MB Eindhoven, Netherlands
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APPLIED PHYSICS LETTERS,
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