共 50 条
- [31] Thermal Dependence of Optical Properties of Silver Thin Films Studied By Spectroscopic Ellipsometry SOLID STATE PHYSICS, PTS 1 AND 2, 2012, 1447 : 673 - 674
- [32] Application of spectroscopic ellipsometry to characterization of optical thin films LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 2002 AND 7TH INTERNATIONAL WORKSHOP ON LASER BEAM AND OPTICS CHARACTERIZATION, 2003, 4932 : 393 - 404
- [33] Analysis of the optical and structural properties of oxide films on InP using spectroscopic ellipsometry Technical Physics, 2013, 58 : 1638 - 1645
- [34] Spectroscopic analysis of tungsten oxide thin films Journal of Materials Research, 2010, 25 : 2401 - 2406
- [37] Parametrization of optical properties of indium-tin-oxide thin films by spectroscopic ellipsometry:: Substrate interfacial reactivity JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2002, 20 (01): : 37 - 42
- [40] Spectroscopic ellipsometry characterization of tungsten-doped vanadium oxide films Zhang, Yuzhi (yzzhang@mail.sic.ac.cn), 2016, Chinese Ceramic Society (44): : 464 - 468