Simulation of the MO film deposition in the magnetron sputtering discharge

被引:0
|
作者
Mitsubishi Chemical Corp, Yokohama, Japan [1 ]
机构
来源
Thin Solid Films | / 1-2卷 / 225-229期
关键词
Computer simulation - Film growth - Magnetooptical effects - Magnetron sputtering - Monte Carlo methods - Sputter deposition - Ternary systems - Thin films;
D O I
暂无
中图分类号
学科分类号
摘要
The Monte Carlo simulation code ACAT-DIFFUSE-GAS has been developed in order to simulate the whole system of a planar magnetron sputtering discharge. The atomic collisions in the Tb-Fe-Co alloy cathode, which lead to sputtering and reflection, are simulated by the ACAT-DIFFUSE routine which includes the compositional change induced by ion influence. The thermalization of sputtered Tb, Fe and Co atoms and reflected Ar atoms in the background Ar gas within the planar magnetron sputtering discharge are simulated by the GAS routine, using the Monte Carlo technique. It is found that the deposited composition rate of Tb, Fe and Co depends strongly on the background pressure. The appreciable amount of energetic reflected Ar atoms transmit at the low pressure and deposit their energies on the magneto-optical film.
引用
收藏
相关论文
共 50 条
  • [21] Simulation and experimental of magnetron sputtering film thickness distribution
    Wang, Jinxin
    Han, Yaping
    Gao, Xuelian
    Luo, Minghai
    Wang, Shaoze
    NEW MATERIALS, APPLICATIONS AND PROCESSES, PTS 1-3, 2012, 399-401 : 1741 - 1745
  • [22] Deposition of Ti thin film using the magnetron sputtering method
    Jung, MJ
    Nam, KH
    Shaginyan, LR
    Han, JG
    THIN SOLID FILMS, 2003, 435 (1-2) : 145 - 149
  • [23] Characterisation of ionised magnetron sputtering plasmas for thin film deposition
    Christou, C
    Kusano, Y
    Chiu, KF
    Hutchings, IM
    Barber, ZH
    INTERNATIONAL CONFERENCE ON PHENOMENA IN IONIZED GAS, VOL I, PROCEEDINGS, 1999, : 35 - 36
  • [24] RuAl Thin-Film Deposition by DC Magnetron Sputtering
    Ott, Vincent
    Wojcik, Tomasz
    Kolozsvari, Szilard
    Polcik, Peter
    Schaefer, Christian
    Pauly, Christoph
    Muecklich, Frank
    Ulrich, Sven
    Mayrhofer, Paul H.
    Riedl, Helmut
    Stueber, Michael
    ADVANCED ENGINEERING MATERIALS, 2025, 27 (03)
  • [25] The influence of magnetron sputtering CoZrNb stochiometric relation in deposition film
    Zhang, JL
    Xiang, SM
    Yang, CS
    FOURTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS, 2000, 4086 : 489 - 491
  • [26] Cubic BN thin film deposition by a RF magnetron sputtering
    Pat, Suat
    Silik, Erbil
    Musaoglu, Caner
    Ozen, Soner
    Mohammadigharehbagh, Reza
    Yudar, H. Hakan
    Korkmaz, Sadan
    VACUUM, 2018, 157 : 31 - 35
  • [27] Features of Indium Tin Oxide Film Deposition by Magnetron Sputtering
    V. A. Luzanov
    Journal of Communications Technology and Electronics, 2020, 65 : 290 - 291
  • [28] Deposition of a Nickel Film by DC Magnetron Sputtering and its Characterization
    Swain, M.
    Bhattacharya, D.
    Bhushan, K. G.
    Basu, S.
    INDIAN VACUUM SOCIETY SYMPOSIUM ON THIN FILMS: SCIENCE & TECHNOLOGY, 2012, 1451 : 182 - 184
  • [29] Effect of substrate bias on the cBN film deposition by magnetron sputtering
    Xu, F. (xufeng@nuaa.edu.cn), 1600, Chinese Ceramic Society, Baiwanzhuang, Beijing, 100831, China (41):
  • [30] Features of Indium Tin Oxide Film Deposition by Magnetron Sputtering
    Luzanov, V. A.
    JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS, 2020, 65 (03) : 290 - 291