共 50 条
- [41] Spectroscopic Ellipsometry of Surface Plasmons 2019 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE & EUROPEAN QUANTUM ELECTRONICS CONFERENCE (CLEO/EUROPE-EQEC), 2019,
- [42] In-situ real time spectroscopic ellipsometry applied to the surface monitoring of semiconductors ADVANCES IN MICROCRYSTALLINE AND NANOCRYSTALLINE SEMICONDUCTORS - 1996, 1997, 452 : 1025 - 1030
- [45] In situ monitoring of the chemisorption of hydrogen atoms on (001) GaAs surface in GaAs atomic layer epitaxy JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1996, 35 (6A): : L710 - L712
- [46] Recent developments in spectroscopic ellipsometry for in situ applications OPTICAL METROLOGY ROADMAP FOR THE SEMICONDUCTOR, OPTICAL, AND DATA STORAGE INDUSTRIES II, 2001, 4449 : 41 - 57
- [47] In Situ Spectroscopic Ellipsometry of SIS Barrier Formation 2014 39TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2014,
- [48] In situ control of SiOx composition by spectroscopic ellipsometry MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2003, 105 (1-3): : 205 - 208
- [49] Real-Time In Situ Monitoring of GaAs (211) Oxide Desorption and CdTe Growth by Spectroscopic Ellipsometry Journal of Electronic Materials, 2012, 41 : 2965 - 2970