iTEM: A temperature-dependent electromigration reliability diagnosis tool

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Avant! Corp, Fremont, United States [1 ]
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IEEE Trans Comput Aided Des Integr Circuits Syst | / 8卷 / 882-893期
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Number:; N00014-95-J-1270; Acronym:; -; Sponsor:; Sponsor: Intel Corporation; F30602-95-C-0069; AFRL; Sponsor: Air Force Research Laboratory;
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