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- [31] Carbon nanotube as probe for atomic force microscope ADVANCES IN MACHINING & MANUFACTURING TECHNOLOGY VIII, 2006, 315-316 : 758 - 761
- [34] Scanning Hall probe microscopy on an atomic force microscope tip JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2001, 19 (04): : 1769 - 1772
- [35] The use of scanning probe microscope with a diamond tip as a nanotechnological tool Journal of Superhard Materials, 2009, 31 : 387 - 391
- [36] High-aspect-ratio nanofabrication using carbon nanotube probe in scanning tunneling microscope PROCEEDINGS OF THE 2005 INTERNATIONAL SYMPOSIUM ON MICRO-NANOMECHATRONICS AND HUMAN SCIENCE: FROM MICRO & NANO SCALE SYSTEMS TO ROBOTICS & MECHATRONICS SYSTEMS, 2005, : 189 - 193
- [38] “Nanotube”: Scanning microscope probe as a controlled source of microwave radiation Technical Physics Letters, 2005, 31 : 464 - 467
- [40] Carbon nanotube probe for scanning tunneling microscopy INTERNATIONAL JOURNAL OF NANOSCIENCE, VOL 4, NO 4, 2005, 4 (04): : 437 - 441