Scanning probe microscope tip with carbon nanotube truss

被引:0
|
作者
机构
[1] Akita, Seiji
[2] 1,Nakayama, Yoshikazu
来源
Akita, S. (akita@pe.osakafu-u.ac.jp) | 1600年 / Japan Society of Applied Physics卷 / 43期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Dual-probe scanning tunneling microscope and a carbon nanotube ring transistor
    Shigematsu, T
    Watanabe, H
    Manabe, C
    Shimotani, K
    Shimizu, M
    SPATIALLY RESOLVED CHARACTERIZATION OF LOCAL PHENOMENA IN MATERIALS AND NANOSTRUCTURES, 2003, 738 : 283 - 288
  • [22] Carbon-nanotube engineering for probes and tweezers operating in scanning probe microscope
    Nakayama, Y
    Akita, S
    NANOTUBE-BASED DEVICES, 2003, 772 : 23 - 34
  • [23] Modeling of electronic transport in scanning tunneling microscope tip-carbon nanotube systems
    Yamada, T
    APPLIED PHYSICS LETTERS, 2001, 78 (12) : 1739 - 1741
  • [24] Tip characterization for scanning probe microscope width metrology
    Dongmo, S
    Villarrubia, JS
    Jones, SN
    Renegar, TB
    Postek, MT
    Song, JF
    CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY, 1998, 449 : 843 - 848
  • [25] Polarization Reversal by Tip of Scanning Probe Microscope in SBN
    Neradovskaya, E. A.
    Neradovskiy, M. M.
    Fedorovyh, V. V.
    Turygin, A. P.
    Shur, V. Ya.
    Kholkin, A. L.
    Ivleva, I. L.
    IV SINO-RUSSIAN ASRTU SYMPOSIUM ON ADVANCED MATERIALS AND PROCESSING TECHNOLOGY, 2016, 2016 : 115 - 121
  • [26] Kinetics of tip induced oxidation by scanning probe microscope
    Gavrilov, SA
    Lemeshko, SV
    Shevyakov, VI
    Roschin, VM
    PHYSICS, CHEMISTRY AND APPLICATION OF NANOSTRUCTURES: REVIEWS AND SHORT NOTES TO NANOMEETING-2001, 2001, : 313 - 316
  • [27] Extraction of inner layer from multiwall carbon nanotubes for scanning probe microscope tip
    Akita, S. (akita@dd.pe.osakafu-u.ac.jp), 2002, The Japan Society of Applied Physics (Institute of Electrical and Electronics Engineers Inc., United States):
  • [28] Extraction of inner shell from multiwall carbon nanotubes for scanning probe microscope tip
    Akita, S
    Nakayama, Y
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2003, 42 (6B): : 3933 - 3936
  • [29] Dual-probe scanning tunneling microscope: Measuring a carbon nanotube ring transistor
    Watanabe, H
    Manabe, C
    Shigematsu, T
    Shimizu, M
    APPLIED PHYSICS LETTERS, 2001, 78 (19) : 2928 - 2930
  • [30] Carbon nanotube tip for scanning tunneling microscopy
    Shingaya, Y
    Nakayama, T
    Aono, M
    PHYSICA B-CONDENSED MATTER, 2002, 323 (1-4) : 153 - 155