共 50 条
- [21] Dual-probe scanning tunneling microscope and a carbon nanotube ring transistor SPATIALLY RESOLVED CHARACTERIZATION OF LOCAL PHENOMENA IN MATERIALS AND NANOSTRUCTURES, 2003, 738 : 283 - 288
- [22] Carbon-nanotube engineering for probes and tweezers operating in scanning probe microscope NANOTUBE-BASED DEVICES, 2003, 772 : 23 - 34
- [24] Tip characterization for scanning probe microscope width metrology CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY, 1998, 449 : 843 - 848
- [25] Polarization Reversal by Tip of Scanning Probe Microscope in SBN IV SINO-RUSSIAN ASRTU SYMPOSIUM ON ADVANCED MATERIALS AND PROCESSING TECHNOLOGY, 2016, 2016 : 115 - 121
- [26] Kinetics of tip induced oxidation by scanning probe microscope PHYSICS, CHEMISTRY AND APPLICATION OF NANOSTRUCTURES: REVIEWS AND SHORT NOTES TO NANOMEETING-2001, 2001, : 313 - 316
- [27] Extraction of inner layer from multiwall carbon nanotubes for scanning probe microscope tip Akita, S. (akita@dd.pe.osakafu-u.ac.jp), 2002, The Japan Society of Applied Physics (Institute of Electrical and Electronics Engineers Inc., United States):
- [28] Extraction of inner shell from multiwall carbon nanotubes for scanning probe microscope tip JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2003, 42 (6B): : 3933 - 3936