Integrated Circuit SNR improvement using Dielectric Altering Compound, Laser Trim, and FIB system

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作者：

Lucent Technologies, Allentown, PA, United States ^{[1
]}

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来源：

Conf. Proc. Int. Symp. Test. Failure Anal. | / 323-326期

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Compendex;

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摘要：

Analog to digital conversion - Computer simulation - Dielectric materials - Electric resistance - Harmonic distortion - Ion beams - Permittivity - Signal to noise ratio - Spurious signal noise

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