Perpendicular magnetic anisotropy in NdFeB thin films
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作者:
Piramanayagam, S.N.
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Dept. of Information Engineering, Shinshu University, Nagano 380-8553, JapanDept. of Information Engineering, Shinshu University, Nagano 380-8553, Japan
Piramanayagam, S.N.
[1
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Matsumoto, M.
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Dept. of Information Engineering, Shinshu University, Nagano 380-8553, JapanDept. of Information Engineering, Shinshu University, Nagano 380-8553, Japan
Matsumoto, M.
[1
]
Morisako, A.
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Dept. of Information Engineering, Shinshu University, Nagano 380-8553, JapanDept. of Information Engineering, Shinshu University, Nagano 380-8553, Japan
Morisako, A.
[1
]
机构:
[1] Dept. of Information Engineering, Shinshu University, Nagano 380-8553, Japan
Nb2Fe14B thin films were analyzed based on perpendicular magnetic anisotropy (PMA). PMA was observed noted when films c axis was oriented perpendicularly to the film plane. Aside from the c-axis orientation, substrate composition and temperature were also found to contribute to the existence of PMA in NdFeB thin films. It was noted that an alteration in a substrate's composition and temperature prompts changes to occur on both the c-axis orientation and PMA.
机构:
Coll William & Mary, Dept Phys, Williamsburg, VA 23187 USAColl William & Mary, Dept Phys, Williamsburg, VA 23187 USA
Skuza, J. R.
Clavero, C.
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Coll William & Mary, Dept Appl Sci, Williamsburg, VA 23187 USAColl William & Mary, Dept Phys, Williamsburg, VA 23187 USA
Clavero, C.
Yang, K.
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Coll William & Mary, Dept Appl Sci, Williamsburg, VA 23187 USAColl William & Mary, Dept Phys, Williamsburg, VA 23187 USA
Yang, K.
Wincheski, B.
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NASA, Nondestruct Evaluat Sci Branch, Langley Res Ctr, Hampton, VA 23681 USAColl William & Mary, Dept Phys, Williamsburg, VA 23187 USA
Wincheski, B.
Lukaszew, R. A.
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机构:
Coll William & Mary, Dept Phys, Williamsburg, VA 23187 USA
Coll William & Mary, Dept Appl Sci, Williamsburg, VA 23187 USAColl William & Mary, Dept Phys, Williamsburg, VA 23187 USA