Surface-attribute probe - an 'active-vision' approach to 3-D object characterization

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Rutgers Univ, Piscataway, United States [1 ]
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Pattern Recognit | / 4卷 / 549-563期
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Acknowledgement--The research reported here was supported by the Center for Computer for Industrial Productivity (CAIP) at Rutgers University with funds provided by the New Jersey Commission for Science and Technology and the Center's industrial members;
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