INTEGRATED CIRCUIT CONTRIBUTIONS TO COLOR TV RECEIVERS.

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作者：
Austin, Wayne
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来源：
RCA Engineer | 1980年 / 25卷 / 06期
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Compendex;
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摘要：
INTEGRATED CIRCUITS
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页码：23 / 29
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[31]   HYBRID INTEGRATED CIRCUIT FOR CHARGE-TO-TIME INTERVAL CONVERSION. [J].
BASILADZE, S.G. ;
DOTSENKO, YU.YU. ;
MAN'YAKOV, P.K. ;
FEDORCHENKO, S.N. .
1982, V 25 (N 1 PT 1) :109-111
[32]   PROBABILITY OF ERROR ANALYSES OF A BFSK FREQUENCY-HOPPING SYSTEM WITH DIVERSITY UNDER PARTIAL-BAND JAMMING INTERFERENCE - PART II: PERFORMANCE OF SQAURE-LAW NONLINEAR COMBINING SOFT DECISION RECEIVERS. [J].
Lee, Jhong S. ;
Miller, Leonard E. ;
Kim, Young K. .
IEEE Transactions on Communications, 1984, COM-32 (12) :1243-1250
[33]   EXPERIMENTAL REAL-TIME COLOR-TV DISPLAY WITH A DC GAS-DISCHARGE PANEL. [J].
Ohishi, Iwao ;
Kojima, Takehiro ;
Ikeda, Hiroaki ;
Toyonaga, Ryuya ;
Murakami, Hiroshi ;
Koike, Junro ;
Tajima, Toshifumi .
Proceedings of the Society for Information Display, 1600, 6 (02) :62-68
[34]   Advantages of Associating a Narrow-Neck 110 degree Color TV Tube with a Toroidal Deflecting Yoke. [J].
Landuyt, M.Robert .
Onde Electrique, 1973, 53 (10) :393-395
[35]   MILLIMETER WAVE INTEGRATED CIRCUIT GUNN OSCILLATOR TECHNOLOGY FOR COMMUNICATION APPLICATIONS. [J].
Chang, Yu Wen ;
Yuan, Lloyd T. .
NTC Conference Record - National Telecommunications Conference, 1979, 3 :1-49
[36]   LSI Test Taken into Account Already at the Design Stage of the Integrated Circuit. [J].
Painke, Helmut .
Elektronik Munchen, 1980, 29 (26) :69-74
[37]   GAAS INTEGRATED-CIRCUIT DEVELOPMENT FOR GIGABIT-RATE SIGNAL-PROCESSING [J].
UPADHYAYULA, LC ;
SMITH, R ;
MATARESE, R .
RCA REVIEW, 1981, 42 (04) :522-541
[38]   Integrated research contributions for screening the tight gas potential in the rotilegendes formation of North-Germany [J].
Pusch, G ;
Gaupp, R ;
Liermann, N .
OIL GAS-EUROPEAN MAGAZINE, 2005, 31 (04) :187-193
[39]   Integrated Circuit SNR improvement using Dielectric Altering Compound, Laser Trim, and FIB system [J].
Lucent Technologies, Allentown, PA, United States .
Conf. Proc. Int. Symp. Test. Failure Anal., (323-326)
[40]   LINEAR RESISTANCE-TO-FREQUENCY CONVERSION EMPLOYING INTEGRATED-CIRCUIT OPERATIONAL-AMPLIFIERS [J].
SENANI, R .
INTERNATIONAL JOURNAL OF ELECTRONICS, 1981, 50 (06) :485-491
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