High-level observability for effective high-level ATPG

被引：0

作者：

Corno, Fulvio ^{[1
]}

Sonza Reorda, Matteo ^{[1
]}

Squillero, Giovanni ^{[1
]}

机构：

[1] Politecnico di Torino, Torino, Italy

来源：

Proceedings of the IEEE VLSI Test Symposium | 2000年

关键词：

Algorithms - Computer hardware description languages - Computer simulation - Computer software - Gates (transistor) - Integrated circuit layout - Observability;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

This paper focuses on observability, one of the open issues in High-Level test generation. Three different approximate metrics for taking observability into account during RT-level ATPG are presented. Metrics range from a really naive and optimistic one to more sophisticated analysis. Metrics are evaluated including them into the calculation of the fitness function used in a RT-level ATPG. Advantages and disadvantages are illustrated. Experimental results show how sharp observability metrics are crucial for making effective RT-level ATPG possible: test sequences generated at RT-level outperform commercial gate-level ATPGs on some ITC99 benchmark circuits.

引用

页码：411 / 416