Resistance of Semiconductor Devices to Electric Surges.

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Lewandowski, Andrzej
Stolarski, Edward
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| 1600年 / 27期
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Results of investigation of Polish-made silicon devices are presented. CCITT recommendations are used because the results of investigation are applicable to the electronic telephone set. Values of nondestructive voltages and mechanisms of destruction are determined. Typical destructions of diodes, transistors and IC are illustrated.
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