Electronic speckle pattern shearing interferometry (ESPSI) and its applications

被引：0
|
作者：
Steinchen, Wolfgang [1 ]
Yang, L.X. [1 ]
Schuth, M. [1 ]
Kupfer, G. [1 ]
机构：
[1] Univ. Gh-Kassel, Kassel, Ger
来源：
Proceedings of SPIE - The International Society for Optical Engineering | 1994年 / 2321卷
关键词：
Interferometric fringes - Speckle pattern shearing interferometry - Strain analysis;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：249 / 252
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