Defects in thick epitaxial GaAs layers

被引：0

作者：

Samic, H. ^{[1
]}

Bourgoin, J.C. ^{[1
]}

机构：

[1] Universite Paris 7, Paris, France

来源：

Materials Science Forum | 1997年 / 258-263卷 / pt 2期

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页码：997 / 1001

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