Near-edge x-ray absorption fine structure and x-ray photoemission spectroscopy study of the InN epilayers on sapphire (0001) substrate

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[1] Lee, Ik Jae
[2] Kim, Jae-Yong
[3] Shin, Hyun-Joon
[4] Kim, Hyung-Kook
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Lee, I.J. (ijlee@postech.ac.kr) | 1600年 / American Institute of Physics Inc.卷 / 95期
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