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Microwave-assisted volatilization of chlorides of Ge and Se for the determination of trace impurities in high purity Ge and Se by ICP-MS
被引:0
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机构
:
[1]
Leng, Ruey-Lin
[2]
1,Sahayam, A.C.
[3]
Jiang, Shiuh-Jen
[4]
Wan, Chia-Ching
来源
:
Jiang, S.-J. (sjjiang@mail.nsysu.edu.tw)
|
1600年
/ Royal Society of Chemistry卷
/ 19期
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