DETERMINATION OF STANDARD DEVIATION IN THICKNESS MEASUREMENT OF THIN SILVER FILMS FROM HALL EFFECT DATA.

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Bhattacharya, I.B.
Bhattacharya, D.L.
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Indian Journal of Pure and Applied Physics | 1976年 / 14卷 / 11期
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摘要：
Several silver films of approximate thickness 540A were prepared by vacuum evaporation and their thicknesses measured by multiple beam interferometry. The values are compared with those obtained graphically from measurements of Hall coefficients of films at room temperature (34 degree C) using the method of W F Leonard and R L Ramey. Standard deviation in thickness is found to be independent of the thickness of the film and the observed maximum standard deviation of 10% may be due to the error in the measurement of the geometry of the film.
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页码：871 / 873
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