DIGEST OF PAPERS - INTERNATIONAL TEST CONFERENCE, 1981.

被引：0

作者：

Anon

机构：

来源：

Proceedings of the ASIS Annual Meeting | 1981年

关键词：

Computers; Microprocessor - DATA STORAGE; DIGITAL - Automatic Testing - ELECTRONIC EQUIPMENT TESTING - Automatic Testing - LOGIC CIRCUITS - Automatic Testing - PRINTED CIRCUITS - Automatic Testing;

D O I：

暂无

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摘要：

Proceedings includes 74 papers divided into 18 sessions dealing with microprocessor testing and modeling, memories, self-testing, CODEC's, testability, printed circuit boards, precision measurement, calibration, test economics, test system architecture, testing in the field, functional testing, and software. Topics considered include: testing of LSI and VLSI circuits, logic circuits, ATE (automated test equipment, digital devices and circuits, electric measuring instruments, image sensors as well as semiconductor and digital data storage devices. Technical and professional papers from this conference are indexed with the conference code no. 00291 in the Ei Engineering Meetings (TM) database produced by Engineering Information, Inc.

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