AUTOMATIC MEASUREMENT OF NOISE IMMUNITY AND ELECTROMAGNETIC COMPATIBILITY OF NONLINEAR MICROWAVE DEVICES.

被引：0

作者：

Egorov, E.A.

Pyrataev, V.I.

机构：

来源：

Measurement Techniques | 1986年 / 29卷 / 06期

关键词：

NOISE IMMUNITY - NONLINEAR MICROWAVE DEVICES - RANDOM AND ARTIFICIAL NOISE;

D O I：

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摘要：

One of the basic characteristics that governs the quality of modern electronic instrumentation is its capability of operating in conditions of random and artificial noise. The difficulties associated of carrying out electronic measurements needed to solve this problem at the research, design, and production stage has led to the development of special equipment: integrated automatic systems for investigation, testing, and prediction of the noise immunity and electromagnetic compatibility of individual components of a system and of the systems as a whole. The problem of noise immunity of electronic equipment must be considered at all stages of development including planning, design, manufacture, and utilization. Requirements to be met are discussed.

引用

页码：574 / 578