Zhengda in-circuit tester

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Dianli Xitong Zidonghue | / 4卷 / 72期

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[41] THE EMS 8000 IN-CIRCUIT EMULATOR
PITTMAN, P
ELECTRONIC ENGINEERING, 1982, 54 (669): : 54 - &
[42] Design for testability for in-circuit test
Johnson, Ken
Surface mount technology, 1990, 4 (02): : 23 - 26
[43] THE CHANGING NATURE OF IN-CIRCUIT TEST
WALSH, D
EE-EVALUATION ENGINEERING, 1994, 33 (02): : 62 - &
[44] IN-CIRCUIT PROGRAMMER CUTS EPROM DAMAGE
OHR, S
ELECTRONIC DESIGN, 1984, 32 (05) : 46 - 46
[45] IN-CIRCUIT TRANSISTOR LEAKAGE CURRENT TESTING
SHAIFER, TR
HEGNER, HR
ASHBY, AT
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1964, IM13 (2-3) : 52 - &
[46] NEW DEVELOPMENTS IN IN-CIRCUIT TESTING.
Burns, Joseph E.
1600, (31):
[47] Circuit board tester
Farbrother, J
ELECTRONICS WORLD, 1998, 104 (1750): : 877 - +
[48] FPGA USES 1149.1 FOR IN-CIRCUIT PROGRAMMING
不详
ELECTRONIC ENGINEERING, 1993, 65 (797): : 29 - &
[49] TECHNOLOGY MAPPING IN-CIRCUIT DESIGN AIDS
KAHRS, M
LOCANTHI, BN
RESTRICK, RC
IEEE DESIGN & TEST OF COMPUTERS, 1994, 11 (03): : 39 - 47
[50] In-circuit testing eases design effort
Black, SL
EDN, 2000, 45 (09) : 111 - +