Zhengda in-circuit tester

被引:0
|
作者
机构
来源
Dianli Xitong Zidonghue | / 4卷 / 72期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] IN-CIRCUIT RESISTANCE MEASUREMENT
    HU, DK
    ELECTRONIC ENGINEERING, 1982, 54 (669): : 27 - 27
  • [22] FOCUS ON IN-CIRCUIT EMULATORS
    NOVELLINO, J
    ELECTRONIC DESIGN, 1987, 35 (27) : 139 - 144
  • [23] UPDATE - IN-CIRCUIT EMULATORS
    MYRVAAGNES, R
    ELECTRONIC PRODUCTS MAGAZINE, 1990, 32 (11): : 35 - 35
  • [24] In-circuit emulators of microprocessors and microcontrollers
    Dolinskii, MS
    Zisel'man, IM
    Fedortsov, AO
    AUTOMATIC CONTROL AND COMPUTER SCIENCES, 1999, 33 (01) : 53 - 56
  • [25] RESISTANCE MEASURING FOR IN-CIRCUIT TESTS
    NITSCHE, W
    F&M-FEINWERKTECHNIK & MESSTECHNIK, 1986, 94 (04): : 243 - 244
  • [26] PICL: Portable In-Circuit Learner
    Fourney, Adam
    Terry, Michael
    UIST'12: PROCEEDINGS OF THE 25TH ANNUAL ACM SYMPOSIUM ON USER INTERFACE SOFTWARE AND TECHNOLOGY, 2012, : 569 - 578
  • [27] In-circuit testing: tomorrows methodology?
    Raymond, D
    ELECTRONIC ENGINEERING, 1997, 69 (851): : 51 - &
  • [28] ECONOMICS OF IN-CIRCUIT TESTING.
    Smith, Tony
    New Electronics, 1979, 12 (23): : 55 - 56
  • [29] Debugging and in-circuit emulation of the future
    Weiss, Norbert
    1996, (104):
  • [30] A USEFUL IDENTITY IN-CIRCUIT THEORY
    ZHU, YS
    CHEN, WK
    JOURNAL OF THE FRANKLIN INSTITUTE-ENGINEERING AND APPLIED MATHEMATICS, 1993, 330 (06): : 1051 - 1061