Measurement of terrace width distribution on an Si(110) surface using high-temperature scanning tunneling microscopy

被引：0
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作者：
Yamamoto, Youiti [1 ]
Sueyoshi, Takashi [1 ]
Sato, Tomoshige [1 ]
Iwatsuki, Masashi [1 ]
机构：
[1] JEOL Ltd, Tokyo, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers | 1997年 / 36卷 / 7 A期
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页码：4468 / 4469
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