Local microstructure of Ge layers buried in a silicon crystal studied by extended X-ray absorption fine structure

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[1] Demchenko, I.N.
[2] Lawniczak-Jablonska, K.
[3] Zhuravlev, K.S.
[4] Piskorska, E.
[5] Nikiforov, A.I.
[6] Welter, E.
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Demchenko, I.N. (demch@ifpan.edu.pl) | 1600年 / Elsevier Ltd卷 / 362期
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俄罗斯基础研究基金会;
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