CHARACTERISTICS OF SEU CURRENT TRANSIENTS AND COLLECTED CHARGE IN GaAs AND Si DEVICES.

被引：0
|
作者：
Shanfield, Z. [1 ]
Moriwaki, M.M. [1 ]
Digby, W.M. [1 ]
Srour, J.R. [1 ]
Campbell, D.E. [1 ]
机构：
[1] Northrop Research & Technology, Cent, Palos Verdes Peninsula, CA,, USA, Northrop Research & Technology Cent, Palos Verdes Peninsula, CA, USA
来源：
IEEE Transactions on Nuclear Science | 1985年 / NS-32卷 / 06期
关键词：
ALPHA PARTICLES - SINGLE EVENT UPSET (SEU);
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