LIQUID CRYSTAL ELECTRICAL CONTINUITY TESTER.

被引：0

作者：

Kumar, A.H.

Murty, K.

机构：

来源：

IBM technical disclosure bulletin | 1983年 / 26卷 / 05期

关键词：

INTEGRATED CIRCUIT MANUFACTURE - Testing - SEMICONDUCTOR DEVICE MANUFACTURE - Testing;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Continuity testing of dense circuit lines (e. g. , on a multilayer ceramic substrate) by point-to-point contact probing is cumbersome and costly. A continuity tester is presented which utilizes the ability of liquid crystals to orient under the influence of an electrical field, giving rise to a visual indication.

引用

页码：2594 / 2595