Model for excess noise in voltage-biased superconducting bolometers

被引：0

作者：

Gildemeister, Jan M. ^{[1
]}

Lee, Adrian T. ^{[1
]}

Richards, Paul L. ^{[1
]}

机构：

[1] Department of Physics, University of California, Berkeley, Berkeley, CA 94720, United States

来源：

Applied Optics | 2001年 / 40卷 / 34期

关键词：

Frequencies - Millimeter waves - Silicon nitride - Spectrum analysis - Superconductivity;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

We are developing superconducting transition-edge bolometers for far-infrared and millimeter wave-lengths. The bolometers described here are suspended by thin legs of silicon nitride for thermal isolation. At frequencies between 200 mHz and 10-50 Hz these devices show white noise at their thermal fluctuation limit (NEP ≈ 10-17W/√Hz). At higher frequencies a broad peak appears in the noise spectrum, which we attribute to a combination of thermal fluctuations in complex thermal circuits and electrothermal feedback. Detailed noise calculations fit the noise measured in three different devices that were specifically designed to test the model. We discuss how changes in bolometer materials can shift the noise peak above the frequency range of interest for most applications.

引用

页码：6229 / 6235