Observations of the Au/Si(111) system with a high-resolution ultrahigh-vacuum scanning electron microscope

被引：0
|
作者：
机构：
[1] Endo, Akira
[2] Ino, Shozo
来源：
Endo, Akira | 1600年 / 32期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] OBSERVATIONS OF THE AU/SI(111) SYSTEM WITH A HIGH-RESOLUTION ULTRAHIGH-VACUUM SCANNING ELECTRON-MICROSCOPE
    ENDO, A
    INO, S
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (10): : 4718 - 4725
  • [2] DEVELOPMENT OF AN ULTRAHIGH-VACUUM HIGH-RESOLUTION SCANNING-TRANSMISSION ELECTRON-MICROSCOPE
    HARADA, Y
    TOMITA, T
    KOKUBO, Y
    DAIMON, H
    INO, S
    JOURNAL OF ELECTRON MICROSCOPY, 1993, 42 (05): : 294 - 304
  • [3] HIGH-RESOLUTION IMAGES OF SURFACE STEPS ON AU PARTICLES WITH ULTRAHIGH-VACUUM ELECTRON-MICROSCOPE
    KONDO, Y
    KOKUBO, Y
    HARADA, Y
    ARAI, Y
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988, (93): : 265 - 266
  • [4] HIGH-RESOLUTION IMAGES OF SURFACE STEPS ON AU PARTICLES WITH ULTRAHIGH-VACUUM ELECTRON-MICROSCOPE
    KONDO, Y
    KOKUBO, Y
    HARADA, Y
    ARAI, Y
    EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 265 - 266
  • [5] OBSERVATIONS OF AU AND AG COADSORBED SI(111) SURFACES BY USING A HIGH-RESOLUTION ULTRA-HIGH-VACUUM SCANNING ELECTRON-MICROSCOPE
    ENDO, A
    SURFACE SCIENCE, 1993, 297 (01) : 71 - 82
  • [6] DESIGN AND DEVELOPMENT OF AN ULTRAHIGH-VACUUM HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPE
    KONDO, Y
    OHI, K
    ISHIBASHI, Y
    HIRANO, H
    HARADA, Y
    TAKAYANAGI, K
    TANISHIRO, Y
    KOBAYASHI, K
    YAGI, K
    ULTRAMICROSCOPY, 1991, 35 (02) : 111 - 118
  • [7] ULTRAHIGH-VACUUM SCANNING ELECTRON-MICROSCOPE
    TOMITA, T
    ITO, T
    KOBAYASHI, H
    KATO, S
    DAIMON, H
    KOKUBO, Y
    HARADA, Y
    INO, S
    JOURNAL OF ELECTRON MICROSCOPY, 1989, 38 (04): : 298 - 298
  • [8] HIGH-RESOLUTION IMAGES OF SURFACE STEPS ON AU PARTICLES WITH ULTRAHIGH-VACUUM ELECTRON-MICROSCOPE .2.
    KONDO, Y
    KOKUBO, Y
    HARADA, Y
    JOURNAL OF ELECTRON MICROSCOPY, 1989, 38 (04): : 318 - 318
  • [9] DESIGN OF A HIGH-RESOLUTION ULTRAHIGH-VACUUM ELECTRON SPECTROMETER
    NEDDERMEYER, H
    ROLOFF, HF
    HEIMANN, P
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, : 787 - 790
  • [10] VERSATILE ULTRAHIGH-VACUUM SCANNING ELECTRON-MICROSCOPE
    BANBURY, JR
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (08): : 798 - &
12345