SCALED CMOS TECHNOLOGY USING SEG ISOLATION AND BURIED WELL PROCESS.

被引:0
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作者
Endo, Nobuhiro [1 ]
Kasai, Naoki [1 ]
Ishitani, Akihiko [1 ]
Kitajima, Hiroshi [1 ]
Kurogi, Yukinori [1 ]
机构
[1] NEC, Kawasaki, Jpn, NEC, Kawasaki, Jpn
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16
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页码:1659 / 1666
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