Speckle decorrelation in surface profilometry by wavelength scanning interferometry

被引：0
|
作者：
Inst of Physical and Chemical, Research, Saitama, Japan [1 ]
机构：
来源：
Appl Opt | / 28卷 / 6721-6728期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
12
引用
收藏
相关论文
共 50 条
  • [21] Potential of a wavelength sampling approach for profilometry by phase shifting interferometry
    Sandoz, P
    Calatroni, J
    Tribillon, G
    JOURNAL OF MODERN OPTICS, 1999, 46 (02) : 327 - 339
  • [22] Surface and thickness measurement of a transparent film using wavelength scanning interferometry
    Gao, Feng
    Muhamedsalih, Hussam
    Jiang, Xiangqian
    OPTICS EXPRESS, 2012, 20 (19): : 21450 - 21456
  • [23] Potential of a wavelength sampling approach for profilometry by phase shifting interferometry
    Laboratoire d'Optique P.M. Duffieux, U.M.R. C.N.R.S. 6603, Univ. de Franche-Comté, F25030 Besanon, France
    不详
    J. Mod. Opt., 2 (327-339):
  • [24] Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser
    Tiziani, HJ
    Franze, B
    Haible, P
    JOURNAL OF MODERN OPTICS, 1997, 44 (08) : 1485 - 1496
  • [25] High-speed dynamic speckle interferometry: phase errors due to intensity, velocity, and speckle decorrelation
    Davila, A
    Huntley, JM
    Kaufmann, GH
    Kerr, D
    APPLIED OPTICS, 2005, 44 (19) : 3954 - 3962
  • [26] FRINGE SCANNING SPECKLE-PATTERN INTERFEROMETRY
    NAKADATE, S
    SAITO, H
    APPLIED OPTICS, 1985, 24 (14) : 2172 - 2180
  • [27] Signal-to-noise based local decorrelation compensation for speckle interferometry applications
    Molimard, Jerome
    Cordero, Raul
    Vautrin, Alain
    APPLIED OPTICS, 2008, 47 (19) : 3535 - 3542
  • [28] Decorrelation-induced phase errors in phase-shifting speckle interferometry
    Lehmann, M
    APPLIED OPTICS, 1997, 36 (16): : 3657 - 3667
  • [29] Evaluation of the performance of tilt scanning interferometry for tomographic imaging and profilometry
    Burlison, B. S. H.
    Ruiz, P. D.
    Huntley, J. M.
    OPTICS COMMUNICATIONS, 2012, 285 (07) : 1654 - 1661
  • [30] Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise
    Jiang, Xiangqian
    Wang, Kaiwei
    Gao, Feng
    Muhamedsalih, Hussam
    APPLIED OPTICS, 2010, 49 (15) : 2903 - 2909
12345