MATURITY FACTORS IN PREDICTING FAILURE RATE FOR LINEAR INTEGRATED CIRCUITS.

被引：0
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作者：
Pantic, Dragan M. [1 ]
机构：
[1] Siliconix Inc, Santa Clara, CA, USA, Siliconix Inc, Santa Clara, CA, USA
来源：
IEEE Transactions on Reliability | 1984年 / R-33卷 / 03期
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摘要：
10
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页码：208 / 212
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