NOISE PROBLEMS IN THE DIGITAL WORLD.

被引：0
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作者：
O'Dell, G.
机构：
来源：
Electronic Engineering (London) | 1986年 / 58卷 / 720期
关键词：
LOGIC CIRCUITS; TRANSISTOR TRANSISTOR - Noise; Spurious Signal - SEMICONDUCTOR DEVICE MANUFACTURE - SEMICONDUCTOR DEVICES; MOS; -; Noise; Spurious Signal;
D O I：
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摘要：
The reasons for the increase of noise problems are examined. The ways in which semiconductor manufacturers can contribute to solving these problems by producing devices which complement packaging techniques to reduce noise generation, cross coupling, and noise response are examined. The particular cases of TTL and CMOS devices are considered.
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