共 50 条
- [22] Implementation of polycrystalline X-ray diffraction for semiconductor metrology 2007 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE, 2007, : 162 - +
- [24] X-ray imaging using fluorescence or polycrystalline diffraction EUROPEAN POWDER DIFFRACTION: EPDIC IV, PTS 1 AND 2, 1996, 228 : 119 - 124
- [25] X-ray diffraction imaging of bulk polycrystalline materials NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 538 (1-3): : 771 - 777
- [26] CONTRIBUTION TO DETERMINATION OF RESIDUAL AUSTENITE BY MEANS OF X-RAY DIFFRACTION METALLURGIA ITALIANA, 1968, 60 (02): : 113 - &
- [30] Analysis of residual stress in polycrystalline silver thin films by x-ray diffraction POLYCRYSTALLINE THIN FILMS - STRUCTURE, TEXTURE, PROPERTIES AND APPLICATIONS III, 1997, 472 : 293 - 298