SIMPLE IC TESTER USING A DATABASE TECHNIQUE.

被引：0

作者：

Wahab, Ala A. ^{[1
]}

Nagarajan, R. ^{[1
]}

Jerew, Dakhil H. ^{[1
]}

机构：

[1] Univ of Basrah, Basrah, Iraq, Univ of Basrah, Basrah, Iraq

来源：

| 1600年 / 10期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

INTEGRATED CIRCUIT TESTING

引用

共 50 条

[1] SIMPLE IC TESTER USING A DATABASE TECHNIQUE
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[2] BOREHOLE SHEAR TESTER - EQUIPMENT AND TECHNIQUE.
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[3] DATABASE-MANAGEMENT IN A MICROCOMPUTER CONTROLLED IC TESTER
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