SINGLE-FAULT DIAGNOSIS OF NONLINEAR RESISTIVE NETWORKS.
被引:0
作者:
Zaghloul, M.E.
论文数: 0引用数: 0
h-index: 0
机构:
George Washington Univ, Washington,, DC, USA, George Washington Univ, Washington, DC, USAGeorge Washington Univ, Washington,, DC, USA, George Washington Univ, Washington, DC, USA
Zaghloul, M.E.
[1
]
Gobovic, D.
论文数: 0引用数: 0
h-index: 0
机构:
George Washington Univ, Washington,, DC, USA, George Washington Univ, Washington, DC, USAGeorge Washington Univ, Washington,, DC, USA, George Washington Univ, Washington, DC, USA
Gobovic, D.
[1
]
机构:
[1] George Washington Univ, Washington,, DC, USA, George Washington Univ, Washington, DC, USA
来源:
IEE proceedings. Part G. Electronic circuits and systems
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1987年
/
134卷
/
01期
The paper presents a simulation-after-test algorithm for fault diagnosis of a nonlinear resistive network. Fault diagnosis equations are expressed in terms of a modified nodal description of the test network. The linear programming technique is used to obtain different solutions of these equations. It is assumed that the maximum number of simultaneous faults in the circuit is bounded. This enables us to apply logical analysis to these solutions and to obtain the diagnosis problem solution. In addition, theoretical conditions under which a faulty element can be located uniquely are discussed. Several numerical examples are given to illustrate the implementation of these algorithms.