MEASUREMENT OF MUTUAL IMPEDANCE IN EDDY CURRENT TESTING COILS.

被引:0
作者
Uetake, Ichizo
Kuwae, Ryokyo
Ito, Hideyuki
机构
来源
Transactions of National Research Institute for Metals (Tokyo) | 1983年 / 25卷 / 02期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
9
引用
收藏
页码:33 / 42
相关论文
共 50 条
[21]   EDDY-CURRENT TESTING PROBE COMPOSED OF PLANAR COILS [J].
YAMADA, S ;
KATOU, M ;
IWAHARA, M ;
DAWSON, FP .
IEEE TRANSACTIONS ON MAGNETICS, 1995, 31 (06) :3185-3187
[22]   Efficient FEM modeling of printed coils for eddy current testing [J].
Zaidi, Houda ;
Santandrea, Laurent ;
Krebs, Guillaume ;
Le Bihan, Yann ;
Demaldent, Edouard .
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2013, 64 (02)
[23]   APPLICATION OF EDDY-CURRENT IMPEDANCE PLANE TESTING [J].
HAGEMAIER, DJ .
MATERIALS EVALUATION, 1984, 42 (08) :1035-1040
[24]   Impedance calculation of arbitrary-shaped thin-walled coils for eddy-current testing of planar media [J].
Wu Dehui ;
Yang Fan ;
Wang Xiaohong ;
He Tianfu .
SENSORS AND ACTUATORS A-PHYSICAL, 2018, 279 :537-542
[25]   IMPEDANCE CHANGES FOR AIR-CORED PROBE-COILS OF FINITE LENGTHS USED FOR EDDY-CURRENT TESTING [J].
HAJIAN, NT ;
BLITZ, J ;
HALL, RB .
NDT INTERNATIONAL, 1983, 16 (01) :3-8
[26]   DESIGN AND FIELD TESTING OF SOLAR-ASSISTED EARTH COILS. [J].
Bose, James E. .
Gateway Energy Conference, 1980, :24-4
[27]   Analytical modeling of wobble in eddy current tube testing with bobbin coils [J].
Theodoulidis, TP .
RESEARCH IN NONDESTRUCTIVE EVALUATION, 2002, 14 (02) :111-126
[28]   Multilayer planar rectangular coils for eddy current testing: Design considerations [J].
Fava, Javier O. ;
Lanzani, Liliana ;
Ruch, Marta C. .
NDT & E INTERNATIONAL, 2009, 42 (08) :713-720
[29]   GMR Versus Differential Coils in Velocity Induced Eddy Current Testing [J].
Ramos, Helena G. ;
Rocha, Tiago ;
Ribeiro, Artur L. ;
Pasadas, Dario .
2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS, 2014, :915-918
[30]   Eddy current testing probe with dual half-cylindrical coils [J].
Bae, BH ;
Choi, JM ;
Kim, SY .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (02) :567-570