Interface roughness characterization using x-ray standing waves

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| 1600年 / American Inst of Physics, Woodbury, NY, USA卷 / 75期

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[1] INTERFACE ROUGHNESS CHARACTERIZATION USING X-RAY STANDING WAVES
KAWAMURA, T
TAKENAKA, H
JOURNAL OF APPLIED PHYSICS, 1994, 75 (08) : 3806 - 3809
[2] Interface roughness and density characterization of multilayer mirrors by using x-ray standing waves
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JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1996, 80 : 449 - 452
[3] INDEPENDENT CHARACTERIZATION OF DENSITY AND INTERFACE ROUGHNESS OF MULTILAYERS USING X-RAY STANDING WAVES
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JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1995, 34 (6A): : 3290 - 3293
[4] Independent characterization of density and interface roughness of multilayers using x-ray standing waves
Kawamura, Tomoaki, 1600, JJAP, Minato-ku, Japan (34):
[5] Interface roughness and density characterization of multilayer mirrors by using x-ray standing waves
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[6] Interface structure in magnetic multilayers using x-ray standing waves
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[7] STRUCTURAL CHARACTERIZATION OF THE (1 MONOLAYER SB)/GAP(110) INTERFACE USING X-RAY STANDING WAVES
MIYANO, KE
KENDELEWICZ, T
WOICIK, JC
COWAN, PL
BOULDIN, CE
KARLIN, BA
PIANETTA, P
SPICER, WE
PHYSICAL REVIEW B, 1992, 46 (11): : 6869 - 6874
[8] X-RAY STANDING WAVES - A POWERFUL TOOL FOR INTERFACE STUDIES
LAGOMARSINO, S
SCARINCI, F
CASTRUCCI, P
GIANNINI, C
ACTA PHYSICA POLONICA A, 1994, 86 (04) : 553 - 566
[9] X-RAY STANDING WAVES
AUTHIER, A
JOURNAL DE PHYSIQUE, 1989, 50 (C7): : C7215 - C7224
[10] X-ray standing waves
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