Study of Ag/SiO2 Nanosystems by XPS

被引：13

作者：

Armelao, Lidia ^{[1
]}

Barreca, Davide ^{[1
]}

Bottaro, Gregorio ^{[1
]}

Gasparotto, Alberto ^{[2
]}

Maragno, Cinzia ^{[2
]}

Tondello, Eugenio ^{[2
]}

机构：

[1] ISTM-CNR and INSTM, Department of Chemistry, Padova University, Via Marzolo, Padova

[2] Department of Chemistry, Padova University and INSTM, Via Marzolo, Padova

来源：

Surface Science Spectra | 2003年 / 10卷 / 01期

关键词：

Italian Research Programs FIRB-MIUR ‘‘Nano-organization of hybrid inorganic/ organic molecules with magnetic and optical properties’’ and FISR-MIUR ‘‘Molecular nanotechnologies for information storage and transmission’’ provided financial assistance for this work;

D O I：

10.1116/11.20040901

中图分类号：

学科分类号：

摘要：

Silica-supported silver nanocomposites were synthesized by rf sputtering of Ag from Ar plasmas. Depositions were performed on amorphous silica substrates at temperatures as low as 60 °C. As a general rule, a careful choice of the synthesis conditions allowed the obtainment of Ag/SiO2 nanosystems with well-tailored chemico-physical properties. In fact, a proper combination of the applied rf power and total pressure resulted in a fine tailoring of the nanosystem structure and morphology, enabling the preparation of both cluster/island-like systems or continuous thin films. A detailed characterization of the obtained specimens was attained by the combined use of several analytical techniques. While laser reflection interferometry (LRI) was employed for an in situ real-time investigation of growth dynamics, glancing-incidence x-ray diffraction (GIXRD), and transmission electron microscopy (TEM) provided useful information on the system nanostructure. Furthermore, x-ray photoelectron spectroscopy (XPS), UV-Vis spectroscopy, and atomic force microscopy (AFM) were used to investigate the chemical composition, optical properties, and surface morphology, respectively. This work has been focused on the XPS characterization of two representative Ag/SiO2 specimens. In particular, detailed scans for the Ag 3d, Ag MVV, Si 2s, O 1s, and C 1s regions and related data for a silver thin film on silica and a discontinuous Ag/SiO2 specimen are presented and discussed. © 2005 American Vacuum Society.

引用

页码：170 / 181

页数：11

共 15 条

[1]

Barreca D., Gasparotto A., Tondello E., Bruno G., Losurdo M., J. Appl. Phys., 96, (2004)

[2]

Barreca D., Bovo A., Gasparotto A., Tondello E., Surf. Sci.Spectra, 10, (2003)

[3]

Gang L., Anderson B.G., van Grondelle J., van Santen R.A., Appl. Catal. B, 40, (2003)

[4]

Cai W., Zhang L., Zhong H., He G., J. Mater. Res., 13, (1998)

[5]

Rizzo A., Tagliente M.A., Alvisi M., Scaglione S., Thin Solid Films, 396, (2001)

[6]

Murakoshi K., Tanaka H., Sawai Y., Nakato Y., Surf. Sci., 532-535, (2003)

[7]

Armelao L., Bertoncello R., Coronaro S., Glisenti A., Sci.Technol. Cultural Heritage, 7, (1998)

[8]

Briggs D., Seah M.P., Practical Surface Analysis, (1983)

[9]

Shirley D.A., Phys. Rev., 55, (1972)

[10]

Weaver J.F., Hoflund G.B., Chem. Mater., 6, (1994)

← 1 2 →