ELECTRON-BEAM STERILIZATION.

被引:0
作者
Anon
机构
来源
Medical Device and Diagnostic Industry | 1980年 / 2卷 / 11期
关键词
Compendex;
D O I
暂无
中图分类号
学科分类号
摘要
STERILIZATION
引用
收藏
页码:45 / 47
相关论文
共 50 条
  • [41] Electromigration Comparison Study of Sn, Ag, and Cu Stripes Fabricated by Electron-Beam Physical Vapor Deposition
    Jin, Zhi
    Huo, Fupeng
    Liu, Xunda
    Nishikawa, Hiroshi
    2022 International Conference on Electronics Packaging, ICEP 2022, 2022, : 203 - 204
  • [42] POWER DENSITY OF ELECTRON BEAM IN AN ELECTRON BEAM WELDER.
    Irie, Hirosada
    Inagaki, Michio
    Transactions of National Research Institute for Metals (Tokyo), 1980, 22 (02): : 95 - 103
  • [43] VLF PLASMA-WAVE EXCITATION DUE TO LOW-ENERGY ELECTRON-BEAM INJECTION - LABORATORY SIMULATION OF A ROCKET EXPERIMENT
    TSUTSUI, M
    HIRAMOTO, K
    MATSUMOTO, H
    KIMURA, I
    JOURNAL OF GEOPHYSICAL RESEARCH-SPACE PHYSICS, 1979, 84 (NA8): : 4217 - 4223
  • [44] X-Ray fluorescence analysis of Ge-As-Se glasses using X-Ray and electron-beam excitation
    Bordovsky, G. A.
    Marchenko, A. V.
    Seregin, P. P.
    Bobokhuzhaev, K. U.
    INORGANIC MATERIALS, 2015, 51 (09) : 939 - 943
  • [45] ALUMINIUM OXIDE FILM PREPARED BY ELECTRON-BEAM EVAPORATION OF SAPPHIRE IN OXYGEN AMBIENT AND ITS APPLICATION TO GaAs MOS DIODES.
    Kusaka, Masahiko
    Hirai, Masaaki
    Okazaki, Susumu
    Reports of The Research Laboratory for Surface Science, Okayama University, 1981, 5 (03): : 31 - 38
  • [46] Electron beam resists
    Kobunshi, 3 (141-142):
  • [47] HIGH CHROMIUM FERRITIC STAINLESS STEELS REFINED BY AOD AND DRIP-TYPE ELECTRON-BEAM AND EFFECT OF INTERSTITIALS ON THEIR HOT DUCTILITY PROPERTIES.
    Strocchi, P.M.
    Ortali, P.L.
    Sarracino, M.
    1600, (68):
  • [48] ELECTRON BEAM WELDING.
    SAUNDER, C.G.S.
    1982, V 29 (N 9): : 40 - 43
  • [49] PROPERTIES OF ELECTRON-BEAM SPATIAL LIGHT MODULATOR BASED ON Bi12GeO20 AND Bi12SiO20 CRYSTALS.
    Butusov, M.M.
    Dun, A.Z.
    Merkin, S.Yu.
    Tukhvatulin, R.Sh.
    Soviet physics. Technical physics, 1981, 26 (01): : 61 - 64
  • [50] CALIBRATION OF ELECTRON DETECTORS USING ELECTRON MICROSCOPE BEAM.
    Kohno, Tsuyoshi
    Yoneda, Akira
    Imai, Takashi
    Takeuchi, Hajime
    Rika Gaku Kenkyujo hokoku, 1984, 60 (05): : 171 - 180