Study on a measuring method for cutting edges of diamond tools by atomic force microscope(AFM)

被引：0
|
作者：
Sun, Tao
Tan, Jiubin
Dong, Shen
机构：
来源：
Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument | 2000年 / 21卷 / 01期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：54 / 57
相关论文
共 50 条
  • [21] Progress in the applications of atomic force microscope (AFM) for mineralogical research
    Liu, Qin
    Fu, Yuhong
    Qin, Zonghua
    Wang, Yun
    Zhang, Shanshan
    Ran, Meimei
    MICRON, 2023, 170
  • [22] Measuring the aerial image with an atomic force microscope
    IBM Advanced Semiconductor, Technology Cent, Hopewell Junction, United States
    Microlithogr World, 1 (4-9):
  • [23] Maximum allowable load of atomic force microscope (AFM) nanorobot
    Korayem, M. H.
    Hoshiar, A. K.
    Ebrahimi, N.
    INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2009, 43 (7-8): : 690 - 700
  • [24] Development of Defocus Atomic Force Microscope (DeF-AFM)
    Cheng, Chung-Hsiang
    Wang, Wei-Min
    Huang, Kuang-Yuh
    SMART SCIENCE, 2023, 11 (01) : 226 - 233
  • [25] THE EVALUATION OF TOPOGRAPHY BORRELIA BURGDORFERI BY ATOMIC FORCE MICROSCOPE (AFM)
    Tokarska-Rodak, Malgorzata
    Koziol-Montewka, Maria
    HEALTH PROBLEMS OF CIVILIZATION, 2015, 9 (03) : 12 - 15
  • [26] CHARACTERIZATION OF PILLARED MONTMORILLONITES WITH THE ATOMIC-FORCE MICROSCOPE (AFM)
    OCCELLI, ML
    DRAKE, B
    GOULD, SAC
    JOURNAL OF CATALYSIS, 1993, 142 (02) : 337 - 348
  • [27] Maximum allowable load of atomic force microscope (AFM) nanorobot
    M. H. Korayem
    A. K. Hoshiar
    N. Ebrahimi
    The International Journal of Advanced Manufacturing Technology, 2009, 43 : 690 - 700
  • [28] Casimir force experiments with quartz tuning forks and an atomic force microscope (AFM)
    Ludwig, T.
    JOURNAL OF PHYSICS A-MATHEMATICAL AND THEORETICAL, 2008, 41 (16)
  • [29] The Study on the Aspect Ratio of Atomic Force Microscope (AFM) Measurements for Triangular Silicon Nanowire
    Za'bah, Nor F.
    Kwa, Kelvin S. K.
    O'Neill, Anthony
    2013 IEEE REGIONAL SYMPOSIUM ON MICRO AND NANOELECTRONICS (RSM 2013), 2013, : 223 - 226
  • [30] Design and fabrication of diamond probe for atomic force microscope
    Shibata, T
    Nakatsuji, T
    Unno, K
    Makino, E
    ELECTRONICS AND STRUCTURES FOR MEMS, 1999, 3891 : 336 - 343
12345