Nonlinear tip-sample interactions affecting frequency responses of microcantilevers in tapping mode atomic forcemicroscopy

被引：0
|
作者：
Hoummady, M. [1 ,2 ]
Rochat, E. [1 ]
Farnault, E. [1 ]
机构：
[1] Laboratory for Integrated Micro-Mechatronic Systems (LIMMS), Institute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-ku Tokyo 106, Japan
[2] Laboratoire de Physique et Métrologie des Oscillateurs, LPMO-CNRS UPR 3203, Centre National de la Recherche Scientifique, 32 Avenue de l'Observatoire, 25044 Besançon Cedex, France
来源：
Applied Physics A: Materials Science and Processing | 1998年 / 66卷 / SUPPL. 1期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Nonlinear tip-sample interactions affecting frequency responses of microcantilevers in tapping mode atomic force microscopy
    Hoummady, M
    Rochat, E
    Farnault, E
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S935 - S938
  • [2] Nonlinear tip–sample interactions affecting frequency responses of microcantilevers in tapping mode atomic force microscopy
    M. Hoummady
    E. Rochat
    E. Farnault
    Applied Physics A, 1998, 66 : S935 - S938
  • [3] Nonlinear vibrations of microcantilevers subjected to tip-sample interactions: Theory and experiment
    Delnavaz, Aidin
    Mahmoodi, S. Nima
    Jalili, Nader
    Mahdi Ahadian, M.
    Zohoor, Hassan
    Journal of Applied Physics, 2009, 106 (11):
  • [4] Nonlinear vibrations of microcantilevers subjected to tip-sample interactions: Theory and experiment
    Delnavaz, Aidin
    Mahmoodi, S. Nima
    Jalili, Nader
    Ahadian, M. Mahdi
    Zohoor, Hassan
    JOURNAL OF APPLIED PHYSICS, 2009, 106 (11)
  • [5] Frequency domain identification of tip-sample van der Waals interactions in resonant atomic force microcantilevers
    Hu, SQ
    Howell, S
    Raman, A
    Reifenberger, R
    Franchek, M
    JOURNAL OF VIBRATION AND ACOUSTICS-TRANSACTIONS OF THE ASME, 2004, 126 (03): : 343 - 351
  • [6] Tapping mode atomic force microscopy for nanoparticle sizing: Tip-sample interaction effects
    Ebenstein, Y
    Nahum, E
    Banin, U
    NANO LETTERS, 2002, 2 (09) : 945 - 950
  • [7] Imaging stability and average tip-sample force in tapping mode atomic force microscopy
    Kowalewski, T
    Legleiter, J
    JOURNAL OF APPLIED PHYSICS, 2006, 99 (06)
  • [8] Imaging stability and average tip-sample force in tapping mode atomic force microscopy
    Kowalewski, Tomasz
    Legleiter, Justin
    Journal of Applied Physics, 2006, 99 (06):
  • [9] Real-Time Estimation of the Tip-Sample Interactions in Tapping Mode Atomic Force Microscopy With a Regularized Kalman Filter
    Keyvani, Aliasghar
    van der Veen, Gijs
    Tamer, Mehmet S.
    Sadeghian, Hamed
    Goosen, Hans
    van Keulen, Fred
    IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2020, 19 (274-283) : 274 - 283
  • [10] Tapping mode atomic force microscopy study of elastomers: Dynamics of tip-sample interaction.
    Bar, G
    Delineau, L
    Brandsch, R
    Whangbo, MH
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 220 : U296 - U296
12345