LSI-component Testing.

被引：0

作者：

Schneider, Birger

机构：

来源：

Elektronikcentralen (Report) ECR | 1980年 / 100期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

INTEGRATED CIRCUIT TESTING

引用

共 50 条

[21] SEGMENTED TESTING.
Robinson, John P.
IEEE Transactions on Computers, 1985, C-34 (05) : 467 - 471
[22] Intelligence Testing.
不详
EUGENICS REVIEW, 1924, 16 (03): : 243 - 243
[23] NONDESTRUCTIVE TESTING.
Montgomery, Steve R.
1985, (107)
[24] PIEZOCONE TESTING.
Sully, John P.
Revista Tecnica INTEVEP, 1985, 5 (01): : 59 - 68
[25] PSEUDORANDOM TESTING.
Wagner, Kenneth D.
Chin, Cary K.
McCluskey, Edward J.
IEEE Transactions on Computers, 1987, C-36 (03) : 332 - 343
[26] Allergy testing.
Taylor, SL
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2002, 224 : U86 - U86
[27] CLIMATIC TESTING.
Bach, Hans Werner
Telcom Report (English Edition), 1980, 3 (04): : 214 - 218
[28] On material testing.
Grun, W
ZEITSCHRIFT DES VEREINES DEUTSCHER INGENIEURE, 1926, 70 : 9 - 12
[29] Disinfectant testing.
Rideal, S
BRITISH MEDICAL JOURNAL, 1919, 1919 : 359 - 360
[30] OPTIMIZATION OF FRINGE-TYPE LASER ANEMOMETERS FOR TURBINE ENGINE COMPONENT TESTING.
Seasholtz, Richard G.
Oberle, Lawrence G.
Weikle, Donald H.
NASA Technical Memorandum, 1984,