首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
Elimination of ghost reflections in x-ray diffraction topography using Soller slits
被引:0
|
作者
:
机构
:
来源
:
J Appl Crystallogr
|
/ pt 3卷
/ 320期
关键词
:
D O I
:
暂无
中图分类号
:
学科分类号
:
摘要
:
引用
收藏
相关论文
共 50 条
[1]
Elimination of ghost reflections in X-ray diffraction topography using Soller slits
Born, E
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,D-81739 MUNICH,GERMANY
SIEMENS AG,D-81739 MUNICH,GERMANY
Born, E
Metzger, T
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,D-81739 MUNICH,GERMANY
SIEMENS AG,D-81739 MUNICH,GERMANY
Metzger, T
WillibaldRiha, E
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,D-81739 MUNICH,GERMANY
SIEMENS AG,D-81739 MUNICH,GERMANY
WillibaldRiha, E
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1997,
30
: 320
-
323
[2]
X-RAY DIFFRACTION TOPOGRAPHY BY A SCANNING SOLLER SLIT ASSEMBLY
OKI, S
论文数:
0
引用数:
0
h-index:
0
OKI, S
FUTAGAMI, K
论文数:
0
引用数:
0
h-index:
0
FUTAGAMI, K
JAPANESE JOURNAL OF APPLIED PHYSICS,
1969,
8
(12)
: 1574
-
&
[3]
EFFECT OF SOLLER SLITS ON X-RAY INTENSITY IN A MODERN DIFFRACTOMETER
STOECKER, WC
论文数:
0
引用数:
0
h-index:
0
STOECKER, WC
STARBUCK, JW
论文数:
0
引用数:
0
h-index:
0
STARBUCK, JW
REVIEW OF SCIENTIFIC INSTRUMENTS,
1965,
36
(11):
: 1593
-
&
[4]
X-ray diffraction from rectangular slits
Le Bolloc'h, D
论文数:
0
引用数:
0
h-index:
0
机构:
UJF, INPG, ENSEEG, LTPCM,UMR CNRS5614, F-38402 St Martin Dheres, France
Le Bolloc'h, D
Livet, F
论文数:
0
引用数:
0
h-index:
0
机构:
UJF, INPG, ENSEEG, LTPCM,UMR CNRS5614, F-38402 St Martin Dheres, France
Livet, F
Bley, F
论文数:
0
引用数:
0
h-index:
0
机构:
UJF, INPG, ENSEEG, LTPCM,UMR CNRS5614, F-38402 St Martin Dheres, France
Bley, F
Schulli, T
论文数:
0
引用数:
0
h-index:
0
机构:
UJF, INPG, ENSEEG, LTPCM,UMR CNRS5614, F-38402 St Martin Dheres, France
Schulli, T
Veron, M
论文数:
0
引用数:
0
h-index:
0
机构:
UJF, INPG, ENSEEG, LTPCM,UMR CNRS5614, F-38402 St Martin Dheres, France
Veron, M
Metzger, TH
论文数:
0
引用数:
0
h-index:
0
机构:
UJF, INPG, ENSEEG, LTPCM,UMR CNRS5614, F-38402 St Martin Dheres, France
Metzger, TH
JOURNAL OF SYNCHROTRON RADIATION,
2002,
9
: 258
-
265
[5]
The outlook for x-ray diffraction topography
Shulpina I.L.
论文数:
0
引用数:
0
h-index:
0
机构:
Ioffe Physicotechnical Institute, Russian Academy of Sciences
Ioffe Physicotechnical Institute, Russian Academy of Sciences
Shulpina I.L.
Suvorov E.V.
论文数:
0
引用数:
0
h-index:
0
机构:
Institute of Solid-State Physics, Russian Academy of Sciences
Ioffe Physicotechnical Institute, Russian Academy of Sciences
Suvorov E.V.
Bulletin of the Russian Academy of Sciences: Physics,
2010,
74
(11)
: 1488
-
1496
[6]
X-RAY DIFFRACTION IN KOLLIMATOR SLITS - PRINCIPAL LIMITS
UNANGST, D
论文数:
0
引用数:
0
h-index:
0
UNANGST, D
ANNALEN DER PHYSIK,
1968,
20
(7-8)
: 358
-
&
[7]
X-ray diffraction effects in submicron slits and channels
Ognev, LI
论文数:
0
引用数:
0
h-index:
0
机构:
RRC Kurchatov Inst, Nucl Fus Inst, Moscow 123182, Russia
RRC Kurchatov Inst, Nucl Fus Inst, Moscow 123182, Russia
Ognev, LI
X-RAY SPECTROMETRY,
2002,
31
(03)
: 274
-
277
[8]
Elimination of X-Ray Diffraction through Stimulated X-Ray Transmission
Wu, B.
论文数:
0
引用数:
0
h-index:
0
机构:
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Dept Appl Phys, Stanford, CA 94035 USA
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Wu, B.
Wang, T.
论文数:
0
引用数:
0
h-index:
0
机构:
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Dept Mat Sci & Engn, Stanford, CA 94035 USA
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Wang, T.
Graves, C. E.
论文数:
0
引用数:
0
h-index:
0
机构:
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Dept Appl Phys, Stanford, CA 94035 USA
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Graves, C. E.
Zhu, D.
论文数:
0
引用数:
0
h-index:
0
机构:
SLAC Natl Accelerator Lab, 2575 Sand Hill Rd, Menlo Pk, CA 94025 USA
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Zhu, D.
Schlotter, W. F.
论文数:
0
引用数:
0
h-index:
0
机构:
SLAC Natl Accelerator Lab, 2575 Sand Hill Rd, Menlo Pk, CA 94025 USA
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Schlotter, W. F.
Turner, J. J.
论文数:
0
引用数:
0
h-index:
0
机构:
SLAC Natl Accelerator Lab, 2575 Sand Hill Rd, Menlo Pk, CA 94025 USA
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Turner, J. J.
Hellwig, O.
论文数:
0
引用数:
0
h-index:
0
机构:
Western Digital Co, HGST, 3403 Yerba Buena Rd, San Jose, CA 95135 USA
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Hellwig, O.
Chen, Z.
论文数:
0
引用数:
0
h-index:
0
机构:
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Dept Phys, Stanford, CA 94035 USA
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Chen, Z.
Duerr, H. A.
论文数:
0
引用数:
0
h-index:
0
机构:
SLAC Natl Accelerator Lab, 2575 Sand Hill Rd, Menlo Pk, CA 94025 USA
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Duerr, H. A.
Scherz, A.
论文数:
0
引用数:
0
h-index:
0
机构:
European XFEL GmbH, Albert Einstein Ring 19, D-22761 Hamburg, Germany
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Scherz, A.
Stohr, J.
论文数:
0
引用数:
0
h-index:
0
机构:
SLAC Natl Accelerator Lab, 2575 Sand Hill Rd, Menlo Pk, CA 94025 USA
SLAC Natl Accelerator Lab, Stanford, CA 94035 USA
Stohr, J.
PHYSICAL REVIEW LETTERS,
2016,
117
(02)
[9]
X-Ray Diffraction Topography Methods (Review)
Lider, V. V.
论文数:
0
引用数:
0
h-index:
0
机构:
Russian Acad Sci, Fed Sci Res Ctr Crystallog & Photon, Shubnikov Inst Crystallog, Moscow 119333, Russia
Russian Acad Sci, Fed Sci Res Ctr Crystallog & Photon, Shubnikov Inst Crystallog, Moscow 119333, Russia
Lider, V. V.
PHYSICS OF THE SOLID STATE,
2021,
63
(02)
: 189
-
214
[10]
USE OF KINEMATICAL DIFFRACTION IN X-RAY TOPOGRAPHY
ALEXANDROPOULOS, NG
论文数:
0
引用数:
0
h-index:
0
ALEXANDROPOULOS, NG
KOTSIS, KT
论文数:
0
引用数:
0
h-index:
0
KOTSIS, KT
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1985,
18
(DEC)
: 509
-
512
←
1
2
3
4
5
→