Corrosion depth profiles by Rutherford backscattering spectrometry and synchrotron X-ray reflectometry

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作者：

KFKI Research Inst for Particle and, Nuclear Physics, Budapest, Hungary ^{[1
]}

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来源：

Mater Sci Forum | / 365-368期

关键词：

Corrosion - Heat treatment - Interfaces (materials) - Iron oxides - Reflectometers - Rutherford backscattering spectroscopy - Synchrotron radiation;

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摘要：

Rutherford backscattering and synchrotron x-ray reflectometry was used to analyze the depth profile of elements in a sputtered iron thin film of originally 20 nm thickness following corrosion heat treatments. An `up to self-consistency' simultaneous evaluation of both kinds of spectra allowed for accurate determination both elemental composition and thickness of the sub-layers. Different iron oxide and oxi-hydroxide layers were identified on top of the iron layer depending on the treatment. An oxide layer of overall composition close to Fe2O3 was also observed at the iron/glass interface.

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