Transverse biased initial susceptibility measurements of magnetization reversal in Fe/MgO(100) thin films

被引：0

作者：

Contreras, Carmen ^{[1
]}

Menéndez, José L. ^{[2
]}

Cebollada, Alfonso ^{[2
]}

Calleja, Javier F. ^{[1
]}

机构：

[1] Universidad de Oviedo, Departamento de Física, Lab. de Magneto-Óptica (LMOV), Calvo Sotelo s/n, 33007 Oviedo, Spain

[2] Inst. Microelectronica Madrid-IMM, Isaac Newton 8 (PTM), Tres Cantos, Madrid 28760, Spain

来源：

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1999年 / 38卷 / 12 A期

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摘要：

Transverse biased initial susceptibility (TBIS) measurements were performed on Fe(100)/MgO(100) thin films, using a magnetooptical Kerr effect system. A peak detected in the TBIS curve when the magnetic field is applied along one of the easy axes, corresponding to a small step in the hysteresis loop, is associated with the uniaxial in-plane anisotropy superimposed on the crystalline biaxial. We proved that TBIS is a suitable and sensitive technique for the study of this phenomenon, and provides an accurate description of the magnetization reversal process.

引用

页码：6699 / 6702