A Study of Solid CO2 by XPS

被引：0

作者：

Dillingham, T.R. ^{[1
]}

Cornelison, D.M. ^{[1
]}

Galle, K. ^{[1
]}

Tegler, S.C. ^{[1
]}

Lutz, B.L. ^{[1
]}

机构：

[1] Dept. of Physics and Astronomy, Northern Arizona University, Flagstaff,AZ,86011, United States

来源：

Surface Science Spectra | 1996年 / 4卷 / 02期

基金：

美国国家科学基金会; 美国国家航空航天局;

关键词：

Spectrometers - X ray photoelectron spectroscopy - Liquefied gases;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

High quality solid CO2 films have been grown on a stainless steel cold-finger using a continuous flow liquid nitrogen system. The solid was formed from research grade (99.995% min. purity) CO2 gas using a gas nozzle placed directly over the cold-finger (at a temperature of approximately 77 K). The base pressure in the chamber was less than 5 × 10−10 T prior to deposition and upon gas introduction was increased, using a precision leak valve, to approximately 5 × 10−8 T. Films were grown in this pressure for 1 h. Gas purity was monitored using a Balzers Prisma QMS 300 quadrapole mass spectrometer. The solid CO2 films were characterized using x-ray photolelectron spectroscopy (XPS). The reported spectra include survey and high resolution scans for the major photoelectron peaks. © 1997 American Vacuum Society.

引用

页码：157 / 160