SELF-TESTING MECHANISM.

被引：0
|
作者：
Blum, A.
机构：
来源：
IBM technical disclosure bulletin | 1984年 / 26卷 / 10 B期
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D O I：
暂无
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学科分类号：
摘要：
INTEGRATED CIRCUIT TESTING
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页码：5566 / 5570
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